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Vol. 146, No. 11, November 2012, pp. 164-169




Structural, Morphological and Optical Properties of Spray Deposited Nanocrystalline ZnO Thin Films:

Effect of Nozzle to Substrate Distance


a* Elahipasha U. MASUMDAR, b Maqbul A. BAROTE

a Thin Film Physics Laboratory, Department of Physics, Rajarshi Shahu Mahavidyalaya - Latur-413512,

Maharashtra, India

b Department of Physics, Azad college, Ausa-413520, Maharashtra, India

Tel.: +91 9421363009

E-mail: emasumdar@yahoo.com


Received: 15 September 2012   /Accepted: 23 November 2012   /Published: 30 November 2012

Digital Sensors and Sensor Sysstems


Abstract: The present work deals with the effect of nozzle to substrate distance on structural, morphological and optical properties of nanocrystalline zinc oxide thin films deposited by chemical spray pyrolysis technique. The XRD analysis revealed that all the films are polycrystalline and are preferentially oriented along (002) plane. This study further the grain structure has considerably improved at nozzle to substrate distance of 28 cm. The morphological observations supported well about importance in grain size with changing nozzle to substrate distance and revealed an average particle size 250 nm. Further, analysis of optical data indicated that the band gap of ZnO films is lying in the range of 3.32 eV to 3.19 eV and found to be dependent of nozzle to substrate distance.


Keywords: Semiconductors, Thin films, Spray pyrolysis, X-ray techniques, Optical properties



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