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Vol. 193, Issue 10, October 2015, pp. 170-178




Reflection from Disordered Silver Nanoparticles on Multilayer Substrate


Department of Aalto Nanofab, School of Electrical Engineering, Aalto University, Espoo, Finland
Tel.: +358503523319, fax: +35894123014

E-mail: Victor.Ovchinnikov@aalto.fi


Received: 31 August 2015 /Accepted: 5 October 2015 /Published: 30 October 2015

Digital Sensors and Sensor Sysstems


Abstract: Reflection from disordered silver nanoparticles on dielectric and multilayer substrates is studied. Optical characterization of nanoparticles on transparent substrates is performed and it is shown that positions of localized surface plasmon resonances in reflection spectra cannot be ascribed to spectrum peaks like it is done in case of extinction spectra. To clarify positions of plasmon resonances in total reflection spectra optical properties of samples are analyzed in relation to their design and morphology. The disordered silver nanoparticles arranged in one- or two layers on substrates from quartz, silicon and oxidized silicon are studied. Extinction and reflection from as prepared, plasma etched and SiO2 covered samples are compared. It is concluded that coupling between nanoparticles, phase shift of scattered light and reflection from film interfaces lead to additional features in reflection spectra in comparison with extinction ones. Recommendations for identification of plasmon resonances in reflection spectra of disordered nanoparticles on multilayer substrates are proposed.


Keywords: Ag nanoparticle, Plasmon resonance, Reflectance, Optical cavity, Irregular array.


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