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Vol. 138, No. 3, March 2012, pp. 22-34




A Compact X-ray Spectrometer Using Silicon Drift Detector


1 M. Shanmugam, 1 Y. B. ACHARYA, 2 V. MISHRA, 2 P. N. PATEL,


1 Physical Research Laboratory, Ahmedabad, India

2 Sardar Vallabhbhai National Institute of Technology, Surat, India

E-mail: shansm@prl.res.in



Received: 11 November 2011   /Accepted: 20 March 2012   /Published: 31 March 2012

Digital Sensors and Sensor Sysstems


Abstract: A compact, low power and low mass Silicon Drift Detector (SDD) based X-ray spectrometer has been developed for obtaining the elemental composition of unknown samples in the X-ray energy region 1 to 25 keV by non-destructive process. Elemental composition of the samples can be obtained by detecting the fluorescent X-rays from the unknown sample. The X-ray fluorescence from unknown sample could be due irradiation of the sample surface with artificial radioactive sources or by means of natural source like sun. The use of new technology X-ray detector such as SDD will provide good energy resolution for detecting the elements which are closely spaced ~150 eV. The developed X-ray spectrometer provides energy resolution (Full Width Half Maximum-FWHM) of about 150 eV at 5.9 keV with low energy threshold of <1 keV. Such instrument has a potential use in scientific analysis of unknown samples such as meteorites, rocks and soils etc. for obtaining their elemental composition. The design of X-ray spectrometer with various subsystems and performance results are discussed in the paper.


Keywords: Silicon drift detector (SDD), X-ray spectrometer, CSPA, Shaping amplifier



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