bullet Cyber-Physical Systems: Metrological Issues


  Title: Cyber-Physical Systems: Metrological Issues

  Editors: S. Yatsyshyn and B. Stadnyk

  Publisher: International Frequency Sensor Association (IFSA) Publishing

  Formats: hardcover (print book) and pdf Acrobat (e-book) 326 pages

  Price: 99.95 EUR for e-book and 129.95 EUR

  Delivery time for print book: 7-17 days dependent on country of destination. Please contact us for priority (5-9 days), ground (3-8 days)
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  Pubdate: 5 November 2016

  ISBN: 978-84-608-9962-4

  e-ISBN: 978-84-617-6200-2



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Cyber-Physical Systems: Metrological Issues



 Book Description



This book presents and considers main trends in the branch of metrology of cyber-physical systems, which are becoming a key element of everyday life. First of all it is destined for engineers, lecturers, students, persons who are not acquainted enough with specificity of cyber-physical systems and their metrology but are interested in it. The authors tried to highlight emergence and development of these systems, combined with the study of their metrology provision and support.





About the Authors


List of Abbreviations


1. Cyber-Physical Systems. Structure, Operation and Problems
1.1. Metrology as a Basis for Designing CPS Models
1.1.1. Typical Examples of CPSs and Experience of Metrological Maintenance
1.1.2. Research on the Nearest Future Generation Communication Technologies
1.2. Metrology to Support the Advanced Communication Technology
1.3. Measurement Technology for both Development and Production
1.3.1. Flexible Metrological Subsystems with Special Simulating Procedures
1.3.2. Metrological Subsystems with Special Standardization Facilities
1.3.3. Dispersed Measuring Subsystems
1.4. Spatial Problems, Volatility and Ageing Problems
1.5. Conclusions



2. Smart Measuring Instruments

2.1. Smart Sensors & Transducers and their Grids
2.1.1. Distributed Sensor Network
2.1.2. Smart Grid Sensor
2.1.3. Middleware and Wireless Sensor Networks
2.2. Metrological Problems of Smart Measuring Instruments
2.2.1. Specificy of Measuring Instruments Due to Their Smartness
2.2.2. Verification of Metrological Software and Middleware
2.2.3. Fractional Processes in Measuring Techniques
2.3. Metrology and Modelling for Additive Manufacturing
2.3.1. Metrological Problems of Additive Manufacturing
2.3.2. Computation Method of Segmental Approximation for Random Topology Single-Surface Reconstruction of Interferometric Patterns
2.3.3. Model-based Diagnostic for Heavy Operating Conditions
2.4. Smart Sensors Grids Implementation
2.4.1. Smart Energetics and Information Support
2.4.2. Smart Energy-Efficient Buildings
2.4.3. Metrological Study of Heat Energy Balance
2.5. Conclusions


3. Embedded Measures as the Measuring Instruments

3.1. Checked Instrument Based on the Inverse of Conductance Quantum
3.2. Study of Quantum Unit of Temperature and Temperature Measuring Standard
3.2.1. Primary Thermometry and Quantum Units of Temperature
3.2.2. Promising Methods of Thermometry
3.2.3. Investigation in Creating the Quantum Unit of Temperature
3.3. Mass Measures with Coded Remote Access
3.4. Conclusions



4. Code-Controllable Measures for Correction of Measuring Channels

4.1. Quality Assurance in Measuring Instrument Design
4.2. Additive Error Correction for Measuring Instrument
4.3. Remote Error Correction of Measuring Channel
4.4. Conclusions



5. Techniques for Accuracy/Trueness Improvement

5.1. Major Metrological Characteristics of CPSs Units within Different Approaches
5.2. Reliability and Accuracy/Trueness of Measurements
5.2.1. Methods to Improve the Accuracy, Errors and Examples of Reduction
5.2.2. Duration of Noise Signal Gauging
5.3. Metrological Problems of Raman Thermometry
5.4. Temperature Dependent Precision Threshold
5.5. Dynamic Error and Instrumental Error
5.6. Methods of Correction and Statistical Minimization of Errors
5.7. Measurement Inexactness in (Nano)thermometry
5.8. Coriolis Mass Flowmeter and its Uncertainty Management
5.8.1. Accuracy Problems on Example of CMF with Straight Tube
5.8.2. CMF Performance Improvement Under the S-type Thermocouples Usage
5.9. Conclusions



6. Frequency, Noise and Spectrum Metrology

6.1. Frequency-Phase Techniques in Thermometry
6.2. Noise Metrology
6.2.1. Fluctuations and Thermodynamics, Proper Noise and Thermometry
6.2.2. Problems and Methodology of Noise Measurements
6.3. Non-Invasive Diagnostics
6.3.1. 1/f Noise Studying for Diagnostics
6.3.2. Passive Method of Electronic Elements Quality Characterization
6.4. Raman Method in Metrology and Thermometry
6.4.1. Metrology of Raman Thermometer with Universal Calibration
6.4.2. Elaboration of Raman Method
6.5. Conclusions


7. Qualimetric Estimation of CPSs and Their Products

7.1. Qualimetry of Natural Gas as Energy Source
7.2. Foundations of Objective Qualimetry
7.3. Objective Qualimetry on the Basis of Thermodynamics
7.4. Conclusions




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