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Vol. 188, Issue 5, May 2015, pp. 1-7

 

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Metrological Array of Cyber-Physical Systems. Part 5.
Quality Assurance in Measuring Instrument Design
 

Yuriy YATSUK, Svyatoslav YATSYSHYN

National University Lviv Polytechnic, Institute of Computer Technologies,

Automation and Metrology, Bandera str.12, Lviv, 79013, Ukraine
Tel.: +38-0322-37-50-89 E-mail: slav.yat@gmail.com

 

Received: 2015 /Accepted: 30 April 2015 /Published: 29 May 2015

Digital Sensors and Sensor Sysstems

 

Abstract: Possibilities of quality evaluation of measuring instruments for Cyber-Physical Systems are studied basing on their objective functional properties. It was proposed to apply the Shannon–Hartley theorem for noisy channel and Hartley logarithmic measure in the selecting, transmission, transforming the measuring signals and defining the amount of measurement data. To ensure the particular level of measuring instruments quality at the design stage due to auto adjustment of errors, the required conditions are researched. The terms of automatic calibration and metrology verification of measuring instruments in situ are considered.

 

Keywords: Cyber-physical system, Metrological assurance, Standard, Quality, Measuring instrument, Errors correction and verification.

 

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