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Vol. 236, Issue 8, August 2019, pp. 1-6




Optical Parametric Investigation on a Poled PVDF Thin-Film for Optoelectronic Devices

1, * Ashok BATRA, 2 Aschalew KASSU, 1 Michael CURLEY, 1 James SAMPSON, 1 Sharvare PALWAI, 1Adina SHOWE

1 Materials Science Group, Department of Physics, Chemistry, and Mathematics
2 Department of Mechanical, Civil Engineering and Construction Management College of Engineering, Technology and Physical Sciences Alabama A&M University 4900 Meridian Street, Normal (Huntsville), Alabama, 35762, USA
1 Tel.: 2563728109, fax: 2563725622

* E-mail: ashok.batra@aamu.edu


Received: 25 June 2019 /Accepted: 26 July 2019 /Published: 31 August 2019

Digital Sensors and Sensor Sysstems


Abstract: Optical quality poly(vinylidene fluoride) film thin film has been selected and all-important optical constants have been determined for the first time via UV-VIS transmission spectroscopy for pure poly(vinylidene fluoride) film in the ferroelectric phase. The ultraviolet-visible spectra showed that the film has wide optical transparency in the entire visible region. The calculated optical parameters include the absorption and extinction coefficients, refractive index, optical density and conductivity, real and imaginary dielectric constants, the dielectric loss tangent, direct and indirect bandgaps of the film. The Raman Infrared Spectroscopy has been recorded in the range 200 to 2250 cm-1 and the functional groups/phases of a film have been identified. The fabricated film is found to be Raman active and the measurement revealed the characteristics  b phase Raman band at about 839 cm-1 which is consistent with literature value.


Keywords: PVDF, Ferroelectric, Electrooptic, Piezoelectric, Optical constants, Raman spectra, Optical bandgap.


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