bullet Sensors & Transducers Journal

    (ISSN 1726- 5479)


2008 e-Impact Factor

25 Top Downloaded Articles

Journal Subscription 2010

Editorial Calendar 2010

Submit an Article

Editorial Board

Current Issue

Sensors & Transducers journal's cover

Sensors & Transducers Journal 2009

Sensors & Transducers Journal 2008

Sensors & Transducers Journal 2007

2000-2002 S&T e-Digest Contents

2003 S&T e-Digest Contents

2004 S&T e-Digest Contents

2005 S&T e-Digest Contents

2006 S&T e-Digest Contents


Best Articles 2009




Vol. 117, Issue 6, June 2010, pp.62-70




Study of Microstructural Parameters of Screen Printed ZnO Thick Film Sensors


*1A. V. PATIL, 1C. G. DIGHAVKAR, 1S. K. SONAWANE, 1U. P. Shinde,
2S. J. PATIL and 2R. Y. BORSE

1 L. V. H. College, Panchavati, Nashik 422003, Maharashtra, India

2 Thin and Thick film Laboratory, Dept. of Electronics M. S. G.College,

Malegaon Camp 423105, Dist. Nashik, Maharashtra, India

*E-mail: aruptl@gmail.com, ratanborse@yahoo.co.in



Received:  8 March 2010   /Accepted: 21 June 2010   /Published: 25 June 2010


Abstract: This paper explores the compositional, morphological and structural properties of ZnO thick films prepared by a standard screen printing method and fired between 650 oC to 900 oC for 2 hours in an air atmosphere. The material characterization was done using X-ray energy dispersive analysis (EDX), X-ray diffraction (XRD) and a scanning electron microscope (SEM). The deposited films were polycrystalline in nature having the wurtzite (hexagonal) structure with a preferred orientation along the (101) plane. The result shows that the wt. % of Zn was found to be 80.39, 82.66 and 83.47 % for firing temperatures of 700, 800 and 900 oC respectively may be due to the release of excess oxygen. The effect of the firing temperature on structural parameters such as the crystallite size, specific surface area, texture coefficient, RMSmicrostrain, dislocation density and stacking fault probability have been studied. The results indicate that grain growth can be increased by increasing the firing temperature which is responsible for decreasing the RMSmicrostrain, stacking fault probability and dislocation density in ZnO thick films. The crystallite size changes from 18.58 nm to 37.23 nm with respect to the increase in the firing temperature.


Keywords: ZnO, Thick films, SEM, XRD, EDX.


Acrobat reader logo Click <here> or title of paper to download the full pages article (856 Kb)





1999 - 2010 Copyright , International Frequency Sensor Association (IFSA). All Rights Reserved.

Home - News - Links - Archives - Tools - Standardization - Patents - Marketplace - Projects - Wish List - Subscribe - Search - Membership - Submit Press Release

 Members Area -Sensors Portal -Training Courses - S&T Digest - For advertisers - Bookstore - Forums - Polls - Sensor Jobs - e-Shop - Site Map