Introduction
to special issue on ADC modelling and testing—9th workshop on ADC
modelling and testing
Pages 195-197
P. Daponte and L. Michaeli
Abstract |
Validity
of Widrow’s model for sinusoidal signals
Pages 198-203
José L. Mariano and Helena Geirinhas Ramos
Abstract |
Functional
simulation of a technique for background calibration of capacitor
mismatch errors in pipelined A/D converters
Pages 204-212
G. Chiorboli and C. Morandi
Abstract |
Principles
of optimisation, modelling and testing of intelligent cyclic A/D
converters
Pages 213-231
A.A. Platonov, K. Jędrzejewski, Ł.M. Małkiewicz and J.
Jasnos
Abstract |
Fast
estimation of ADC nonlinearities using the Sinewave Histogram Test
Pages 232-237
F. Stefani, A. Moschitta, D. Macii, P. Carbone and D. Petri
Abstract |
Noise
sensitivity of the exponential histogram ADC test
Pages 238-244
Ján Šaliga, Linus Michaeli and Roland Holcer
Abstract |
Synthesis
of binary test sequences with good spectral properties using an
evolutionary algorithm
Pages 245-251
D.A. Lampasi, L. Podestà and P. Carbone
Abstract |
Sinewave
generation with on board DAC non-linearity compensation using a ΣΔ
approach
Pages 252-257
A. Sabatini, A. Moschitta and P. Carbone
Abstract |
Recent
developments on DAC modelling, testing and standardization
Pages 258-266
E. Balestrieri, P. Daponte and S. Rapuano
Abstract |
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Journal: Measurement