Editorial Board

Abdul Rahim, Ruzairi, Universiti Teknologi, Malaysia

Abramchuk, George, Measur. Tech. & Advanced Applications, Canada

Aluri, Geetha S., Globalfoundries, USA

Ascoli, Giorgio, George Mason University, USA

Atalay, Selcuk, Inonu University, Turkey

Atghiaee, Ahmad, University of Tehran, Iran

Augutis, Vygantas, Kaunas University of Technology, Lithuania

Ayesh, Aladdin, De Montfort University, UK

Baliga, Shankar, B., Laser Components DG, Inc., USA

Barlingay, Ravindra, Larsen & Toubro - Technology Services, India

Basu, Sukumar, Jadavpur University, India

Bousbia-Salah, Mounir, University of Annaba, Algeria

Bouvet, Marcel, University of Burgundy, France

Campanella, Luigi, University La Sapienza, Italy

Carvalho, Vitor, Minho University, Portugal

Changhai, Ru, Harbin Engineering University, China

Chen, Wei, Hefei University of Technology, China

Cheng-Ta, Chiang, National Chia-Yi University, Taiwan

Cherstvy, Andrey, University of Potsdam, Germany

Chung, Wen-Yaw, Chung Yuan Christian University, Taiwan

Cortes, Camilo A., Universidad Nacional de Colombia, Colombia

D'Amico, Arnaldo, Università di Tor Vergata, Italy

De Stefano, Luca, Institute for Microelectronics and Microsystem, Italy

Ding, Jianning, Changzhou University, China

Djordjevich, Alexandar, City University of Hong Kong, Hong Kong

Donato, Nicola, University of Messina, Italy

Dong, Feng, Tianjin University, China

Erkmen, Aydan M., Middle East Technical University, Turkey

Fezari, Mohamed, Badji Mokhtar Annaba University, Algeria

Gaura, Elena, Coventry University, UK

Gole, James, Georgia Institute of Technology, USA

Gong, Hao, National University of Singapore, Singapore

Gonzalez de la Rosa, Juan Jose, University of Cadiz, Spain

Goswami, Amarjyoti, Kaziranga University, India

Guillet, Bruno, University of Caen, France

Hadjiloucas, Sillas, The University of Reading, UK

Hao, Shiying, Michigan State University, USA

Hui, David, University of New Orleans, USA

Jaffrezic-Renault, Nicole, Claude Bernard University Lyon 1, France

Jamil, Mohammad, Qatar University, Qatar

Kaniusas, Eugenijus, Vienna University of Technology, Austria

Kim, Min Young, Kyungpook National University, South Korea

Kumar, Arun, University of Delaware, USA

Lay-Ekuakille, Aime, University of Lecce, Italy

Li, Fengyuan, HARMAN International, USA

Li, Jingsong, Anhui University, China

Li, Si, GE Global Research Center, USA

Lin, Paul, Cleveland State University, USA

Liu, Aihua, Chinese Academy of Sciences, China

Liu, Chenglian, Long Yan University, China

Liu, Fei, City College of New York, USA

Mahadi, Muhammad, University Tun Hussein Onn Malaysia, Malaysia

Mansor, Muhammad Naufal, University Malaysia Perlis, Malaysia

Marquez, Alfredo, Centro de Investigacion en Materiales Avanzados, Mexico Mishra, Vivekanand, National Institute of Technology, India

Moghavvemi, Mahmoud, University of Malaya, Malaysia

Morello, Rosario, University "Mediterranea" of Reggio Calabria, Italy

Mulla, Imtiaz Sirajuddin, National Chemical Laboratory, Pune, India

Nabok, Aleksey, Sheffield Hallam University, UK

Neshkova, Milka, Bulgarian Academy of Sciences, Bulgaria

Pal, Jitendra, Carnegie Mellon University, USA

Passaro, Vittorio M. N., Politecnico di Bari, Italy

Patil, Devidas Ramrao, R. L. College, Parola, India

Penza, Michele, ENEA, Italy

Pereira, Jose Miguel, Instituto Politecnico de Setebal, Portugal

Pillarisetti, Anand, Sensata Technologies Inc, USA

Pogacnik, Lea, University of Ljubljana, Slovenia

Pullini, Daniele, Centro Ricerche FIAT, Italy

Qiu, Liang, Avago Technologies, USA

Reig, Candid, University of Valencia, Spain

Restivo, Maria Teresa, University of Porto, Portugal

Rodríguez Martínez, Angel, Universidad Politécnica de Cataluña, Spain

Sadana, Ajit, University of Mississippi, USA

Sadeghian Marnani, Hamed, TU Delft, The Netherlands

Sapozhnikova, Ksenia, D. I. Mendeleyev Institute for Metrology, Russia

Singhal, Subodh Kumar, National Physical Laboratory, India

Shah, Kriyang, La Trobe University, Australia

Shi, Wendian, California Institute of Technology, USA

Shmaliy, Yuriy, Guanajuato University, Mexico

Song, Xu, An Yang Normal University, China

Srivastava, Arvind K., Systron Donner Inertial, USA

Stefanescu, Dan Mihai, Romanian Measurement Society, Romania Sumriddetchkajorn, Sarun, Nat. Electr. & Comp. Tech. Center, Thailand

Sun, Zhiqiang, Central South University, China

Sysoev, Victor, Saratov State Technical University, Russia

Thirunavukkarasu, I., Manipal University Karnataka, India

Thomas, Sadiq, Heriot Watt University, Edinburgh, UK

Tian, Lei, Xidian University, China

Tianxing, Chu, Research Center for Surveying & Mapping, Beijing, China

Vanga, Kumar L., ePack, Inc., USA

Vazquez, Carmen, Universidad Carlos III Madrid, Spain

Wang, Jiangping, Xian Shiyou University, China

Wang, Peng, Qualcomm Technologies, USA

Wang, Zongbo, University of Kansas, USA

Xu, Han, Measurement Specialties, Inc., USA

Xu, Weihe, Brookhaven National Lab, USA

Xue, Ning, Agiltron, Inc., USA

Yang, Dongfang, National Research Council, Canada

Yang, Shuang-Hua, Loughborough University, UK

Yaping Dan, Harvard University, USA

Yue, Xiao-Guang, Shanxi University of Chinese Traditional Medicine, China

Xiao-Guang, Yue, Wuhan University of Technology, China

Zakaria, Zulkarnay, University Malaysia Perlis, Malaysia

Zhang, Weiping, Shanghai Jiao Tong University, China

Zhang, Wenming, Shanghai Jiao Tong University, China

Zhang, Yudong, Nanjing Normal University China